Generation of compact test sets with high defect coverage.

Xrysovalantis Kavousianos Krishnendu Chakrabarty Generation of compact test sets with high defect coverage. 1130-1135 2009 DATE http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090833&count=326&index=219 conf/date/2009 db/conf/date/date2009.html#KavousianosC09