BibTeX record conf/date/IwamaHKS97

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@inproceedings{DBLP:conf/date/IwamaHKS97,
  author       = {Kazuo Iwama and
                  Kensuke Hino and
                  Hiroyuki Kurokawa and
                  Sunao Sawada},
  title        = {Random benchmark circuits with controlled attributes},
  booktitle    = {European Design and Test Conference, ED{\&}TC '97, Paris, France,
                  17-20 March 1997},
  pages        = {90--97},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/EDTC.1997.582338},
  doi          = {10.1109/EDTC.1997.582338},
  timestamp    = {Fri, 20 May 2022 15:59:03 +0200},
  biburl       = {https://dblp.org/rec/conf/date/IwamaHKS97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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