BibTeX record conf/date/ImhofW14

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@inproceedings{DBLP:conf/date/ImhofW14,
  author       = {Michael E. Imhof and
                  Hans{-}Joachim Wunderlich},
  editor       = {Gerhard P. Fettweis and
                  Wolfgang Nebel},
  title        = {Bit-Flipping Scan - {A} unified architecture for fault tolerance and
                  offline test},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2014, Dresden, Germany, March 24-28, 2014},
  pages        = {1--6},
  publisher    = {European Design and Automation Association},
  year         = {2014},
  url          = {https://doi.org/10.7873/DATE.2014.206},
  doi          = {10.7873/DATE.2014.206},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/date/ImhofW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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