Myeong-Eun Hwang Tamer Cakici Kaushik Roy Interactive presentation: Process tolerant beta-ratio modulation for ultra-dynamic voltage scaling. 1550-1555 2007 conf/date/2007 DATE http://doi.acm.org/10.1145/1266366.1266705 db/conf/date/date2007.html#HwangCR07