Luong Dinh Hung Hidetsugu Irie Masahiro Goshima Shuichi Sakai Utilization of SECDED for soft error and variation-induced defect tolerance in caches. 1134-1139 2007 conf/date/2007 DATE http://doi.acm.org/10.1145/1266366.1266612 db/conf/date/date2007.html#HungIGS07