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BibTeX record conf/date/HsiehLB07
@inproceedings{DBLP:conf/date/HsiehLB07, author = {Tong{-}Yu Hsieh and Kuen{-}Jong Lee and Melvin A. Breuer}, editor = {Rudy Lauwereins and Jan Madsen}, title = {Reduction of detected acceptable faults for yield improvement via error-tolerance}, booktitle = {2007 Design, Automation and Test in Europe Conference and Exposition, {DATE} 2007, Nice, France, April 16-20, 2007}, pages = {1599--1604}, publisher = {{EDA} Consortium, San Jose, CA, {USA}}, year = {2007}, url = {https://dl.acm.org/citation.cfm?id=1266717}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/HsiehLB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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