Power constrained and defect-probability driven SoC test scheduling with test set partitioning.

Zhiyuan He Zebo Peng Petru Eles Power constrained and defect-probability driven SoC test scheduling with test set partitioning. 291-296 2006 conf/date/2006p DATE http://doi.acm.org/10.1145/1131562 db/conf/date/date2006p.html#HePE06