Hamidreza Hashempour Jos Dohmen Bratislav Tasic Bram Kruseman Camelia Hora Maikel van Beurden Yizi Xing Test time reduction in analogue/mixed-signal devices by defect oriented testing: An industrial example. 371-376 2011 DATE http://ieeexplore.ieee.org/xpls/abs_all.jsp?arnumber=5763065 conf/date/2011 db/conf/date/date2011.html#HashempourDTKHBX11