BibTeX record conf/date/GielenWMLMKGRN08

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@inproceedings{DBLP:conf/date/GielenWMLMKGRN08,
  author       = {Georges G. E. Gielen and
                  Pieter De Wit and
                  Elie Maricau and
                  Johan Loeckx and
                  Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
                  Ben Kaczer and
                  Guido Groeseneken and
                  Rosana Rodr{\'{\i}}guez and
                  Montserrat Nafr{\'{\i}}a},
  editor       = {Donatella Sciuto},
  title        = {Emerging Yield and Reliability Challenges in Nanometer {CMOS} Technologies},
  booktitle    = {Design, Automation and Test in Europe, {DATE} 2008, Munich, Germany,
                  March 10-14, 2008},
  pages        = {1322--1327},
  publisher    = {{ACM}},
  year         = {2008},
  url          = {https://doi.org/10.1109/DATE.2008.4484862},
  doi          = {10.1109/DATE.2008.4484862},
  timestamp    = {Fri, 24 Mar 2023 00:02:45 +0100},
  biburl       = {https://dblp.org/rec/conf/date/GielenWMLMKGRN08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}