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BibTeX record conf/date/FengVJRV19
@inproceedings{DBLP:conf/date/FengVJRV19, author = {Keven Feng and Sandeep Vora and Rui Jiang and Elyse Rosenbaum and Shobha Vasudevan}, editor = {J{\"{u}}rgen Teich and Franco Fummi}, title = {Guilty As Charged: Computational Reliability Threats Posed By Electrostatic Discharge-induced Soft Errors}, booktitle = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition, {DATE} 2019, Florence, Italy, March 25-29, 2019}, pages = {156--161}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.23919/DATE.2019.8715149}, doi = {10.23919/DATE.2019.8715149}, timestamp = {Wed, 16 Oct 2019 14:14:53 +0200}, biburl = {https://dblp.org/rec/conf/date/FengVJRV19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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