BibTeX record conf/date/BeckBKPLP05

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@inproceedings{DBLP:conf/date/BeckBKPLP05,
  author       = {Matthias Beck and
                  Olivier Barondeau and
                  Martin Kaibel and
                  Frank Poehl and
                  Xijiang Lin and
                  Ron Press},
  title        = {Logic Design for On-Chip Test Clock Generation - Implementation Details
                  and Impact on Delay Test Quality},
  booktitle    = {2005 Design, Automation and Test in Europe Conference and Exposition
                  {(DATE} 2005), 7-11 March 2005, Munich, Germany},
  pages        = {56--61},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/DATE.2005.199},
  doi          = {10.1109/DATE.2005.199},
  timestamp    = {Fri, 24 Mar 2023 00:02:46 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BeckBKPLP05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}