BibTeX
@inproceedings{DBLP:conf/date/BeckBKPLP05,
author = {Matthias Beck and
Olivier Barondeau and
Martin Kaibel and
Frank Poehl and
Xijiang Lin and
Ron Press},
title = {Logic Design for On-Chip Test Clock Generation - Implementation
Details and Impact on Delay Test Quality},
booktitle = {DATE},
year = {2005},
pages = {56-61},
ee = {http://doi.ieeecomputersociety.org/10.1109/DATE.2005.199},
crossref = {DBLP:conf/date/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/date/2005,
title = {2005 Design, Automation and Test in Europe Conference and
Exposition (DATE 2005), 7-11 March 2005, Munich, Germany},
booktitle = {DATE},
publisher = {IEEE Computer Society},
year = {2005},
isbn = {0-7695-2288-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2005-04-13 by Michael Ley (ley@uni-trier.de)