BibTeX record conf/date/BanerjeeCHC21

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@inproceedings{DBLP:conf/date/BanerjeeCHC21,
  author       = {Sanmitra Banerjee and
                  Arjun Chaudhuri and
                  Shao{-}Chun Hung and
                  Krishnendu Chakrabarty},
  title        = {Advances in Testing and Design-for-Test Solutions for {M3D} Integrated
                  Circuits},
  booktitle    = {Design, Automation {\&} Test in Europe Conference {\&} Exhibition,
                  {DATE} 2021, Grenoble, France, February 1-5, 2021},
  pages        = {152--157},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.23919/DATE51398.2021.9473921},
  doi          = {10.23919/DATE51398.2021.9473921},
  timestamp    = {Mon, 03 Jan 2022 22:40:09 +0100},
  biburl       = {https://dblp.org/rec/conf/date/BanerjeeCHC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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