Amirali Shayan Arani Xiang Hu He Peng Chung-Kuan Cheng Wenjian Yu Mikhail Popovich Thomas Toms Xiaoming Chen Reliability aware through silicon via planning for 3D stacked ICs. 288-291 2009 DATE http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090673&count=326&index=59 conf/date/2009 db/conf/date/date2009.html#AraniHPCYPTC09