BibTeX record conf/dasc/TanXYZC21

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@inproceedings{DBLP:conf/dasc/TanXYZC21,
  author       = {Ding Tan and
                  Xingyu Xu and
                  Kaixiang Yu and
                  Sihai Zhang and
                  Tianchi Chen},
  title        = {Multi-Feature Shuffle Algorithm for Root Cause Detection in Semiconductor
                  Manufacturing},
  booktitle    = {{IEEE} Intl Conf on Dependable, Autonomic and Secure Computing, Intl
                  Conf on Pervasive Intelligence and Computing, Intl Conf on Cloud and
                  Big Data Computing, Intl Conf on Cyber Science and Technology Congress,
                  DASC/PiCom/CBDCom/CyberSciTech 2021, Canada, October 25-28, 2021},
  pages        = {130--136},
  publisher    = {{IEEE}},
  year         = {2021},
  url          = {https://doi.org/10.1109/DASC-PICom-CBDCom-CyberSciTech52372.2021.00034},
  doi          = {10.1109/DASC-PICOM-CBDCOM-CYBERSCITECH52372.2021.00034},
  timestamp    = {Thu, 11 May 2023 07:39:07 +0200},
  biburl       = {https://dblp.org/rec/conf/dasc/TanXYZC21.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}