BibTeX record conf/dac/YuKL87

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@inproceedings{DBLP:conf/dac/YuKL87,
  author       = {Philip S. Yu and
                  C. Mani Krishna and
                  Yann{-}Hang Lee},
  editor       = {A. O'Neill and
                  D. Thomas},
  title        = {{VLSI} Circuit Testing Using an Adaptive Optimization Model},
  booktitle    = {Proceedings of the 24th {ACM/IEEE} Design Automation Conference. Miami
                  Beach, FL, USA, June 28 - July 1, 1987},
  pages        = {399--406},
  publisher    = {{IEEE} Computer Society Press / {ACM}},
  year         = {1987},
  url          = {https://doi.org/10.1145/37888.37948},
  doi          = {10.1145/37888.37948},
  timestamp    = {Sat, 10 Sep 2022 20:48:50 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/YuKL87.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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