@inproceedings{DBLP:conf/dac/YilmazO09,
  author    = {Ender Yilmaz and
               Sule Ozev},
  title     = {Adaptive test elimination for analog/RF circuits},
  booktitle = {DAC},
  year      = {2009},
  pages     = {720-725},
  ee        = {http://doi.acm.org/10.1145/1629911.1630098},
  crossref  = {DBLP:conf/dac/2009},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dac/2009,
  title     = {Proceedings of the 46th Design Automation Conference, DAC
               2009, San Francisco, CA, USA, July 26-31, 2009},
  booktitle = {DAC},
  publisher = {ACM},
  year      = {2009},
  isbn      = {978-1-60558-497-3},
  ee        = {http://dl.acm.org/citation.cfm?id=1629911},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}