BibTeX record conf/dac/YeC12

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@inproceedings{DBLP:conf/dac/YeC12,
  author       = {Fangming Ye and
                  Krishnendu Chakrabarty},
  editor       = {Patrick Groeneveld and
                  Donatella Sciuto and
                  Soha Hassoun},
  title        = {{TSV} open defects in 3D integrated circuits: characterization, test,
                  and optimal spare allocation},
  booktitle    = {The 49th Annual Design Automation Conference 2012, {DAC} '12, San
                  Francisco, CA, USA, June 3-7, 2012},
  pages        = {1024--1030},
  publisher    = {{ACM}},
  year         = {2012},
  url          = {https://doi.org/10.1145/2228360.2228545},
  doi          = {10.1145/2228360.2228545},
  timestamp    = {Mon, 03 Jan 2022 22:34:11 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/YeC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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