Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing.

Xiaoqing Wen Kohei Miyase Tatsuya Suzuki Seiji Kajihara Yuji Ohsumi Kewal K. Saluja Critical-Path-Aware X-Filling for Effective IR-Drop Reduction in At-Speed Scan Testing. 527-532 2007 conf/dac/2007 DAC http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375221 db/conf/dac/dac2007.html#WenMSKOS07