Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence.

Vineeth Veetil Dennis Sylvester David Blaauw Saumil Shah Steffen Rochel Efficient smart sampling based full-chip leakage analysis for intra-die variation considering state dependence. 154-159 2009 DAC http://doi.acm.org/10.1145/1629911.1629956 conf/dac/2009 db/conf/dac/dac2009.html#VeetilSBSR09