BibTeX
@inproceedings{DBLP:conf/dac/VeetilSBSR09,
author = {Vineeth Veetil and
Dennis Sylvester and
David Blaauw and
Saumil Shah and
Steffen Rochel},
title = {Efficient smart sampling based full-chip leakage analysis
for intra-die variation considering state dependence},
booktitle = {DAC},
year = {2009},
pages = {154-159},
ee = {http://doi.acm.org/10.1145/1629911.1629956},
crossref = {DBLP:conf/dac/2009},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dac/2009,
title = {Proceedings of the 46th Design Automation Conference, DAC
2009, San Francisco, CA, USA, July 26-31, 2009},
booktitle = {DAC},
publisher = {ACM},
year = {2009},
isbn = {978-1-60558-497-3},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2009-10-23 by Michael Ley (ley@uni-trier.de)