Ashish Srivastava Saumil Shah Kanak Agarwal Dennis Sylvester David Blaauw Stephen W. Director Accurate and efficient gate-level parametric yield estimation considering correlated variations in leakage power and performance. 535-540 2005 conf/dac/2005 DAC http://doi.acm.org/10.1145/1065579.1065718 db/conf/dac/dac2005.html#SrivastavaSASBD05