DBLP Record 'conf/dac/SrivastavaSASBD05'

BibTeX

@inproceedings{DBLP:conf/dac/SrivastavaSASBD05,
  author    = {Ashish Srivastava and
               Saumil Shah and
               Kanak Agarwal and
               Dennis Sylvester and
               David Blaauw and
               Stephen W. Director},
  title     = {Accurate and efficient gate-level parametric yield estimation
               considering correlated variations in leakage power and performance},
  booktitle = {DAC},
  year      = {2005},
  pages     = {535-540},
  ee        = {http://doi.acm.org/10.1145/1065579.1065718},
  crossref  = {DBLP:conf/dac/2005},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dac/2005,
  editor    = {William H. Joyner Jr. and
               Grant Martin and
               Andrew B. Kahng},
  title     = {Proceedings of the 42nd Design Automation Conference, DAC
               2005, San Diego, CA, USA, June 13-17, 2005},
  booktitle = {DAC},
  publisher = {ACM},
  year      = {2005},
  isbn      = {1-59593-058-2},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}