On tests to detect via opens in digital CMOS circuits.

Sudhakar M. Reddy Irith Pomeranz Chen Liu On tests to detect via opens in digital CMOS circuits. 840-845 2008 DAC http://doi.acm.org/10.1145/1391469.1391682 conf/dac/2008 db/conf/dac/dac2008.html#ReddyPL08