BibTeX
@inproceedings{DBLP:conf/dac/ReddyPL08,
author = {Sudhakar M. Reddy and
Irith Pomeranz and
Chen Liu},
title = {On tests to detect via opens in digital CMOS circuits},
booktitle = {DAC},
year = {2008},
pages = {840-845},
ee = {http://doi.acm.org/10.1145/1391469.1391682},
crossref = {DBLP:conf/dac/2008},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dac/2008,
editor = {Limor Fix},
title = {Proceedings of the 45th Design Automation Conference, DAC
2008, Anaheim, CA, USA, June 8-13, 2008},
booktitle = {DAC},
publisher = {ACM},
year = {2008},
isbn = {978-1-60558-115-6},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2008-07-30 by Michael Ley (ley@uni-trier.de)