BibTeX record conf/dac/RashedA0E22

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@inproceedings{DBLP:conf/dac/RashedA0E22,
  author       = {Muhammad Rashedul Haq Rashed and
                  Amro Awad and
                  Sumit Kumar Jha and
                  Rickard Ewetz},
  editor       = {Rob Oshana},
  title        = {Towards resilient analog in-memory deep learning via data layout re-organization},
  booktitle    = {{DAC} '22: 59th {ACM/IEEE} Design Automation Conference, San Francisco,
                  California, USA, July 10 - 14, 2022},
  pages        = {859--864},
  publisher    = {{ACM}},
  year         = {2022},
  url          = {https://doi.org/10.1145/3489517.3530532},
  doi          = {10.1145/3489517.3530532},
  timestamp    = {Sat, 30 Sep 2023 09:38:31 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/RashedA0E22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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