BibTeX record conf/dac/OgiharaMYM89

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@inproceedings{DBLP:conf/dac/OgiharaMYM89,
  author    = {Takuji Ogihara and
               K. Muroi and
               Genichi Yonemori and
               Shinichi Murai},
  title     = {{MULTES/IS:} An Effective and Reliable Test Generation System for
               Partial Scan and Non-Scan Synchronous Circuits},
  booktitle = {{DAC}},
  pages     = {519--524},
  year      = {1989},
  url       = {http://doi.acm.org/10.1145/74382.74469},
  doi       = {10.1145/74382.74469},
  timestamp = {Thu, 09 Feb 2012 17:37:36 +0100},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/dac/OgiharaMYM89},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}