BibTeX
@inproceedings{DBLP:conf/dac/MitraKSZ05,
author = {Subhasish Mitra and
Tanay Karnik and
Norbert Seifert and
Ming Zhang},
title = {Logic soft errors in sub-65nm technologies design and CAD
challenges},
booktitle = {DAC},
year = {2005},
pages = {2-4},
ee = {http://doi.acm.org/10.1145/1065579.1065585},
crossref = {DBLP:conf/dac/2005},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dac/2005,
editor = {William H. Joyner Jr. and
Grant Martin and
Andrew B. Kahng},
title = {Proceedings of the 42nd Design Automation Conference, DAC
2005, San Diego, CA, USA, June 13-17, 2005},
booktitle = {DAC},
publisher = {ACM},
year = {2005},
isbn = {1-59593-058-2},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-02-10 by Michael Ley (ley@uni-trier.de)