<?xml version="1.0"?>
<dblp>
<inproceedings key="conf/dac/LeeNB92" mdate="2006-05-31">
<author>Kuen-Jong Lee</author>
<author>Charles Njinda</author>
<author>Melvin A. Breuer</author>
<title>SWiTEST: A Switch Level Test Generation System for CMOS Combinational Circuits.</title>
<pages>26-29</pages>
<year>1992</year>
<booktitle>DAC</booktitle>
<ee>http://portal.acm.org/citation.cfm?id=113938.113931</ee>
<url>db/conf/dac/dac92.html#LeeNB92</url>
</inproceedings>
</dblp>
