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@inproceedings{DBLP:conf/dac/LeeNB92,
author = {Kuen-Jong Lee and
Charles Njinda and
Melvin A. Breuer},
title = {SWiTEST: A Switch Level Test Generation System for CMOS
Combinational Circuits},
booktitle = {DAC},
year = {1992},
pages = {26-29},
ee = {http://portal.acm.org/citation.cfm?id=113938.113931},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2006-05-31 by Michael Ley (ley@uni-trier.de)