BibTeX record conf/dac/LeeH90

download as .bib file

@inproceedings{DBLP:conf/dac/LeeH90,
  author       = {Hyung Ki Lee and
                  Dong Sam Ha},
  editor       = {Richard C. Smith},
  title        = {{SOPRANO:} An Efficient Automatic Test Pattern Generator for Stuck-Open
                  Faults in {CMOS} Combinational Circuits},
  booktitle    = {Proceedings of the 27th {ACM/IEEE} Design Automation Conference. Orlando,
                  Florida, USA, June 24-28, 1990},
  pages        = {660--666},
  publisher    = {{IEEE} Computer Society Press},
  year         = {1990},
  url          = {https://doi.org/10.1145/123186.123432},
  doi          = {10.1145/123186.123432},
  timestamp    = {Tue, 06 Nov 2018 16:58:15 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/LeeH90.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.