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BibTeX record conf/dac/KrasniewskiA85
@inproceedings{DBLP:conf/dac/KrasniewskiA85, author = {Andrzej Krasniewski and Alexander Albicki}, editor = {Hillel Ofek and Lawrence A. O'Neill}, title = {Simulation-free estimation of speed degradation in {NMOS} self-testing circuits for {CAD} applications}, booktitle = {Proceedings of the 22nd {ACM/IEEE} conference on Design automation, {DAC} 1985, Las Vegas, Nevada, USA, 1985}, pages = {808--811}, publisher = {{ACM}}, year = {1985}, url = {https://doi.org/10.1145/317825.318001}, doi = {10.1145/317825.318001}, timestamp = {Tue, 06 Nov 2018 16:58:18 +0100}, biburl = {https://dblp.org/rec/conf/dac/KrasniewskiA85.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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