@inproceedings{DBLP:conf/dac/HeloueAN07,
author = {Khaled R. Heloue and
Navid Azizi and
Farid N. Najm},
title = {Modeling and Estimation of Full-Chip Leakage Current Considering
Within-Die Correlation},
booktitle = {DAC},
year = {2007},
pages = {93-98},
ee = {http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375131},
crossref = {DBLP:conf/dac/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dac/2007,
title = {Proceedings of the 44th Design Automation Conference, DAC
2007, San Diego, CA, USA, June 4-8, 2007},
booktitle = {DAC},
publisher = {IEEE},
year = {2007},
ee = {http://dl.acm.org/citation.cfm?id=1278480},
bibsource = {DBLP, http://dblp.uni-trier.de}
}