BibTeX record conf/dac/GuoRP99

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@inproceedings{DBLP:conf/dac/GuoRP99,
  author       = {Ruifeng Guo and
                  Sudhakar M. Reddy and
                  Irith Pomeranz},
  editor       = {Mary Jane Irwin},
  title        = {Proptest: {A} Property Based Test Pattern Generator for Sequential
                  Circuits Using Test Compaction},
  booktitle    = {Proceedings of the 36th Conference on Design Automation, New Orleans,
                  LA, USA, June 21-25, 1999},
  pages        = {653--659},
  publisher    = {{ACM} Press},
  year         = {1999},
  url          = {https://doi.org/10.1145/309847.310019},
  doi          = {10.1145/309847.310019},
  timestamp    = {Sun, 04 Aug 2024 19:37:26 +0200},
  biburl       = {https://dblp.org/rec/conf/dac/GuoRP99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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