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@inproceedings{DBLP:conf/dac/GhoshF00,
author = {Indradeep Ghosh and
Masahiro Fujita},
title = {Automatic test pattern generation for functional RTL circuits
using assignment decision diagrams},
booktitle = {DAC},
year = {2000},
pages = {43-48},
ee = {http://doi.acm.org/10.1145/337292.337309},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2002-12-16 by Michael Ley (ley@uni-trier.de)