ElmWIZLM08'

@inproceedings{DBLP:conf/dac/ElmWIZLM08,
  author    = {Melanie Elm and
               Hans-Joachim Wunderlich and
               Michael E. Imhof and
               Christian G. Zoellin and
               Jens Leenstra and
               Nicolas M{\"a}ding},
  title     = {Scan chain clustering for test power reduction},
  booktitle = {DAC},
  year      = {2008},
  pages     = {828-833},
  ee        = {http://doi.acm.org/10.1145/1391469.1391680},
  crossref  = {DBLP:conf/dac/2008},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}

@proceedings{DBLP:conf/dac/2008,
  editor    = {Limor Fix},
  title     = {Proceedings of the 45th Design Automation Conference, DAC
               2008, Anaheim, CA, USA, June 8-13, 2008},
  booktitle = {DAC},
  publisher = {ACM},
  year      = {2008},
  isbn      = {978-1-60558-115-6},
  ee        = {http://dl.acm.org/citation.cfm?id=1391469},
  bibsource = {DBLP, http://dblp.uni-trier.de}
}