BibTeX record conf/dac/ChuengDRR00

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@inproceedings{DBLP:conf/dac/ChuengDRR00,
  author       = {Kwang{-}Ting Cheng and
                  Sujit Dey and
                  Mike Rodgers and
                  Kaushik Roy},
  editor       = {Giovanni De Micheli},
  title        = {Test challenges for deep sub-micron technologies},
  booktitle    = {Proceedings of the 37th Conference on Design Automation, Los Angeles,
                  CA, USA, June 5-9, 2000},
  pages        = {142--149},
  publisher    = {{ACM}},
  year         = {2000},
  url          = {https://doi.org/10.1145/337292.337353},
  doi          = {10.1145/337292.337353},
  timestamp    = {Tue, 06 Nov 2018 16:58:16 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/ChuengDRR00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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