Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability.

Lerong Cheng Puneet Gupta Costas J. Spanos Kun Qian Lei He Physically justifiable die-level modeling of spatial variation in view of systematic across wafer variability. 104-109 2009 DAC http://doi.acm.org/10.1145/1629911.1629945 conf/dac/2009 db/conf/dac/dac2009.html#ChengGSQH09