BibTeX record conf/dac/ChenRPR06

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@inproceedings{DBLP:conf/dac/ChenRPR06,
  author       = {Gang Chen and
                  Sudhakar M. Reddy and
                  Irith Pomeranz and
                  Janusz Rajski},
  editor       = {Ellen Sentovich},
  title        = {A test pattern ordering algorithm for diagnosis with truncated fail
                  data},
  booktitle    = {Proceedings of the 43rd Design Automation Conference, {DAC} 2006,
                  San Francisco, CA, USA, July 24-28, 2006},
  pages        = {399--404},
  publisher    = {{ACM}},
  year         = {2006},
  url          = {https://doi.org/10.1145/1146909.1147015},
  doi          = {10.1145/1146909.1147015},
  timestamp    = {Tue, 06 Nov 2018 16:58:15 +0100},
  biburl       = {https://dblp.org/rec/conf/dac/ChenRPR06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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