Michael L. Behm John M. Ludden Yossi Lichtenstein Michal Rimon Michael Vinov Industrial experience with test generation languages for processor verification. 36-40 2004 conf/dac/2004 DAC http://doi.acm.org/10.1145/996566.996578 db/conf/dac/dac2004.html#BehmLLRV04