BibTeX
@inproceedings{DBLP:conf/dac/AgarwalN07,
author = {Kanak Agarwal and
Sani R. Nassif},
title = {Characterizing Process Variation in Nanometer CMOS},
booktitle = {DAC},
year = {2007},
pages = {396-399},
ee = {http://doi.ieeecomputersociety.org/10.1109/DAC.2007.375195},
crossref = {DBLP:conf/dac/2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/dac/2007,
title = {Proceedings of the 44th Design Automation Conference, DAC
2007, San Diego, CA, USA, June 4-8, 2007},
booktitle = {DAC},
publisher = {IEEE},
year = {2007},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
Copyright © 2007-06-29 by Michael Ley (ley@uni-trier.de)