BibTeX record conf/cvpr/KayaalpRJ89

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@inproceedings{DBLP:conf/cvpr/KayaalpRJ89,
  author       = {Ali E. Kayaalp and
                  A. Ravishankar Rao and
                  Ramesh C. Jain},
  title        = {Scanning electron microscope based stereo analysis [for semiconductor
                  {IC} inspection]},
  booktitle    = {{IEEE} Computer Society Conference on Computer Vision and Pattern
                  Recognition, {CVPR} 1989, 4-8 June, 1989, San Diego, CA, {USA}},
  pages        = {429--434},
  publisher    = {{IEEE}},
  year         = {1989},
  url          = {https://doi.org/10.1109/CVPR.1989.37882},
  doi          = {10.1109/CVPR.1989.37882},
  timestamp    = {Sat, 26 Oct 2019 12:05:31 +0200},
  biburl       = {https://dblp.org/rec/conf/cvpr/KayaalpRJ89.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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