BibTeX record: conf/csse/ArmoushSK08

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@inproceedings{DBLP:conf/csse/ArmoushSK08,
  author    = {Ashraf Armoush and
               Falk Salewski and
               Stefan Kowalewski},
  title     = {Effective Pattern Representation for Safety Critical Embedded Systems},
  booktitle = {International Conference on Computer Science and Software Engineering,
               {CSSE} 2008, Volume 4: Embedded Programming / Database Technology
               / Neural Networks and Applications / Other Applications, December
               12-14, 2008, Wuhan, China},
  year      = {2008},
  pages     = {91--97},
  crossref  = {DBLP:conf/csse/2008-4},
  url       = {http://dx.doi.org/10.1109/CSSE.2008.739},
  doi       = {10.1109/CSSE.2008.739},
  timestamp = {Thu, 23 Oct 2014 00:52:50 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/csse/ArmoushSK08},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}
@proceedings{DBLP:conf/csse/2008-4,
  title     = {International Conference on Computer Science and Software Engineering,
               {CSSE} 2008, Volume 4: Embedded Programming / Database Technology
               / Neural Networks and Applications / Other Applications, December
               12-14, 2008, Wuhan, China},
  year      = {2008},
  publisher = {{IEEE} Computer Society},
  isbn      = {978-0-7695-3336-0},
  timestamp = {Thu, 23 Oct 2014 00:52:50 +0200},
  biburl    = {http://dblp.uni-trier.de/rec/bib/conf/csse/2008-4},
  bibsource = {dblp computer science bibliography, http://dblp.org}
}