Thilo Mende Felix Beckwermert Rainer Koschke Gerald Meier Supporting the Grow-and-Prune Model in Software Product Lines Evolution Using Clone Detection. 163-172 2008 CSMR http://dx.doi.org/10.1109/CSMR.2008.4493311 conf/csmr/2008 db/conf/csmr/csmr2008.html#MendeBKM08