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BibTeX record conf/csa2/BaekSLL17
@inproceedings{DBLP:conf/csa2/BaekSLL17, author = {Dusan Baek and Jong{-}Hwan Shin and Byungjeong Lee and Jung{-}Won Lee}, editor = {James J. Park and Vincenzo Loia and Gangman Yi and Yunsick Sung}, title = {Defect Management Method for Content-based Document Artifact Test in Software R{\&}D Project}, booktitle = {Advances in Computer Science and Ubiquitous Computing - {CSA/CUTE} 2017, Taichung, Taiwan, 18-20 December}, series = {Lecture Notes in Electrical Engineering}, volume = {474}, pages = {1192--1198}, publisher = {Springer}, year = {2017}, url = {https://doi.org/10.1007/978-981-10-7605-3\_190}, doi = {10.1007/978-981-10-7605-3\_190}, timestamp = {Thu, 08 Aug 2019 13:43:14 +0200}, biburl = {https://dblp.org/rec/conf/csa2/BaekSLL17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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