BibTeX record conf/csa2/BaekSLL17

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@inproceedings{DBLP:conf/csa2/BaekSLL17,
  author       = {Dusan Baek and
                  Jong{-}Hwan Shin and
                  Byungjeong Lee and
                  Jung{-}Won Lee},
  editor       = {James J. Park and
                  Vincenzo Loia and
                  Gangman Yi and
                  Yunsick Sung},
  title        = {Defect Management Method for Content-based Document Artifact Test
                  in Software R{\&}D Project},
  booktitle    = {Advances in Computer Science and Ubiquitous Computing - {CSA/CUTE}
                  2017, Taichung, Taiwan, 18-20 December},
  series       = {Lecture Notes in Electrical Engineering},
  volume       = {474},
  pages        = {1192--1198},
  publisher    = {Springer},
  year         = {2017},
  url          = {https://doi.org/10.1007/978-981-10-7605-3\_190},
  doi          = {10.1007/978-981-10-7605-3\_190},
  timestamp    = {Thu, 08 Aug 2019 13:43:14 +0200},
  biburl       = {https://dblp.org/rec/conf/csa2/BaekSLL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}