BibTeX record conf/crv/TehT22

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@inproceedings{DBLP:conf/crv/TehT22,
  author       = {Eu Wern Teh and
                  Graham W. Taylor},
  title        = {Understanding the impact of image and input resolution on deep digital
                  pathology patch classifiers},
  booktitle    = {19th Conference on Robots and Vision, {CRV} 2022, Toronto, ON, Canada,
                  May 31 - June 2, 2022},
  pages        = {159--166},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/CRV55824.2022.00028},
  doi          = {10.1109/CRV55824.2022.00028},
  timestamp    = {Wed, 14 Sep 2022 17:01:22 +0200},
  biburl       = {https://dblp.org/rec/conf/crv/TehT22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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