Ching-Pao Chang Jia-Lyn Lv Chih-Ping Chu A Defect Estimation Approach for Sequential Inspection Using a Modified Capture-Recapture Model. 41-46 2005 conf/compsac/2005 COMPSAC (1) http://doi.ieeecomputersociety.org/10.1109/COMPSAC.2005.19 db/conf/compsac/compsac2005-1.html#ChangLC05