@inproceedings{DBLP:conf/compcon/SwartzlanderEH85,
author = {Earl E. Swartzlander Jr. and
John A. Eldon and
De D. Hsu},
title = {VLSI Testing: A Decade of Experience},
booktitle = {COMPCON},
year = {1985},
pages = {392-396},
crossref = {DBLP:conf/compcon/1985},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
@proceedings{DBLP:conf/compcon/1985,
title = {Spring COMPCON'85, Digest of Papers, Thirtieth IEEE Computer
Society International Conference, San Francisco, California,
USA, February 25-28, 1985},
booktitle = {COMPCON},
publisher = {IEEE Computer Society},
year = {1985},
isbn = {0-8186-0613-4},
bibsource = {DBLP, http://dblp.uni-trier.de}
}
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