BibTeX record conf/coins/MihCPWD23

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@inproceedings{DBLP:conf/coins/MihCPWD23,
  author       = {Atah Nuh Mih and
                  Hung Cao and
                  Joshua K. Pickard and
                  Monica Wachowicz and
                  Rickey Dubay},
  title        = {TransferD2: Automated Defect Detection Approach in Smart Manufacturing
                  using Transfer Learning Techniques},
  booktitle    = {{IEEE} International Conference on Omni-layer Intelligent Systems,
                  {COINS} 2023, Berlin, Germany, July 23-25, 2023},
  pages        = {1--8},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/COINS57856.2023.10189312},
  doi          = {10.1109/COINS57856.2023.10189312},
  timestamp    = {Mon, 15 Jan 2024 21:17:06 +0100},
  biburl       = {https://dblp.org/rec/conf/coins/MihCPWD23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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