BibTeX record conf/cits/WangLYLZZ20

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@inproceedings{DBLP:conf/cits/WangLYLZZ20,
  author       = {Yifan Wang and
                  Zhongxu Li and
                  Xuecheng Yang and
                  Ning Luo and
                  Yu Zhao and
                  Gang Zhou},
  editor       = {Mohammad S. Obaidat and
                  Kuei{-}Fang Hsiao and
                  Petros Nicopolitidis and
                  Daniel Cascado Caballero},
  title        = {Insulator Defect Recognition Based on Faster {R-CNN}},
  booktitle    = {International Conference on Computer, Information and Telecommunication
                  Systems, {CITS} 2020, Hangzhou, China, October 5-7, 2020},
  pages        = {1--4},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/CITS49457.2020.9232614},
  doi          = {10.1109/CITS49457.2020.9232614},
  timestamp    = {Tue, 27 Oct 2020 13:51:25 +0100},
  biburl       = {https://dblp.org/rec/conf/cits/WangLYLZZ20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}