BibTeX record conf/cit/ChakravartyS22

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@inproceedings{DBLP:conf/cit/ChakravartyS22,
  author       = {Krishna Chakravarty and
                  Jagannath Singh},
  title        = {Optimizing Defect Removal Efficiency by Defect Prediction using Machine
                  Learning},
  booktitle    = {{OITS} International Conference on Information Technology, {OCIT}
                  2022, Bhubaneswar, India, December 14-16, 2022},
  pages        = {205--210},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/OCIT56763.2022.00047},
  doi          = {10.1109/OCIT56763.2022.00047},
  timestamp    = {Fri, 10 Mar 2023 12:02:44 +0100},
  biburl       = {https://dblp.org/rec/conf/cit/ChakravartyS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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